![[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Compensating Differences Between Measurement and Calibation Wafer in Probe Tip Calibrations - Deembedding of Line Parameters]()
[IEEE 28th European Microwave Conference, 1998 - Amsterdam, Netherlands (1998.10.4-1998.10.6)] 28th European Microwave Conference, 1998 - Compensating Differences Between Measurement and Calibation Wafer in Probe Tip Calibrations - Deembedding of Line ParametersCarchon, G.; Schreurs, D.; Vandenberghe, S.; Nauwelaers, B.; De Raedt, W. · 1998