![[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced fault isolation technique using electro-optical terahertz pulse reflectometry]()
[IEEE 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2012) - Singapore, Singapore (2012.07.2-2012.07.6)] 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits - Advanced fault isolation technique using electro-optical terahertz pulse reflectometryTay, M. Y.; Cao, L.; Venkata, M.; Tran, L.; Donna, W.; Qiu, W.; Alton, J.; Taday, P. F.; Lin, M. · 2012