![[IEEE 6th International Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (23-26 Sept. 2002)] Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering - The new methods automated photoelectric spectral analysis with use the standard samples and virtual standards]()
[IEEE 6th International Conference on Actual Problems of Electronic Instrument Engineering - APEIE - Novosibirsk, Russia (23-26 Sept. 2002)] Proceedings, 6th International Conference on Actual Problems of Electronic Instrument Engineering - The new methods automated photoelectric spectral analysis with use the standard samples and virtual standardsVeshkurtsev, J.M.; Odinets, A.I.; Altyntsev, M.P. · 2002