CORRESPONDENCE
- 期刊名称Ostrich
- 作者Crosby, Owen; Rennie, Fergus; Jenner, A. B.; Roberts, E. R.; Hewitt, John; Prinsloo, Hein F.; Prinsloo, Hein F.
- 卷第15卷
- 期第2期
- 印刷ISSN0030-6525
- 电子ISSN1727-947X
- 文件大小399.75KB
- 发表时间1944-09
- DOI10.1080/00306525.1944.9634706
- 页码142-147
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[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Laser optical in-circuit measurement system for immunity applicationsChong Ding, ; Pommerenke, D. · 2006
[IEEE 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Arlington, VA, USA (2006.10.4-2006.10.4)] 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Soft Error Masking Circuit and Latch Using Schmitt Trigger CircuitSasaki, Yoichi; Namba, Kazuteru; Ito, Hideo · 2006