Annual Meeting Notes for the Society for Applied Spectroscopy and the Society of Public Analysts
- 期刊名称Analytical Chemistry
- 卷第25卷
- 期第7期
- 印刷ISSN0003-2700
- 电子ISSN1520-6882
- 文件大小2743.35KB
- 发表时间1953-07
- DOI10.1021/ac60079a603
- 页码1128-1130
Effective diffusion length of multicrystalline solar cellsDonolato, C · Semiconductor Science and Technology · 1998
An inverse problem of charge-collection microscopyDonolato, C · Inverse Problems · 1986
Voronoi network modelling of multicrystalline silicon solar cellsDonolato, C · Semiconductor Science and Technology · 2000
The statics of the wedge-shaped jar openerDonolato, C · European Journal of Physics · 2015
ChemInform Abstract: CHARACTERIZATION OF MICROPLASMA SITES IN SILICON N+-P JUNCTIONSDONOLATO, C.; MERLI, P. G.; VECCHI, I. · Chemischer Informationsdienst · 1977
The space-charge region around a metallic platelet in a semiconductorDonolato, C · Semiconductor Science and Technology · 1993
Anxiety profiles and protective factors: A latent profile analysis in childrenMammarella, Irene C.; Donolato, Enrica; Caviola, Sara; Giofrè, David · Personality and Individual Differences · 2018
An application of Thomson s theorem to the determination of induced charge densityDonolato, C · European Journal of Physics · 2003
Electro-rheologyBlock, H; Kelly, J P · Journal of Physics D: Applied Physics · 1988
Semiconductor nanowiresLu, Wei; Lieber, Charles M · Journal of Physics D: Applied Physics · 2006
Nanoassembled model catalystsHeiz, Ueli; Schneider, Wolf-Dieter · Journal of Physics D: Applied Physics · 2000
Mechanisms for exchange biasStamps, R L · Journal of Physics D: Applied Physics · 2000
Thermal plasma waste treatmentHeberlein, Joachim; Murphy, Anthony B · Journal of Physics D: Applied Physics · 2008
Surface enhanced fluorescenceFort, Emmanuel; Grésillon, Samuel · Journal of Physics D: Applied Physics · 2008
Nanocomposite dielectrics—properties and implicationsNelson, J K; Hu, Y · Journal of Physics D: Applied Physics · 2005
Memristor-based neural networksThomas, Andy · Journal of Physics D: Applied Physics · 2013