![[IEEE 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems - Cancun, Mexico (15-17 March 2000)] Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) - Characterisation of radiation effects on MOSFET using genetic algorithms]()
[IEEE 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems - Cancun, Mexico (15-17 March 2000)] Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) - Characterisation of radiation effects on MOSFET using genetic algorithmsPicos, R.; Roca, M.; Calvo, O.; Garcia-Moreno, E. · 2000