海量图书期刊资源，随时随地畅享阅读乐趣
[IEEE 2017 IEEE 35th VLSI Test Symposium (VTS) - Las Vegas, NV, USA (2017.4.9-2017.4.12)] 2017 IEEE 35th VLSI Test Symposium (VTS) - Innovative practices session 10B innovative practices in Asia-2: From cost perspectiveHatayama, Kazumi; Ishida, Masahiro · 2017