Negative resistance behavior in double injection structures
- 作者Marsh, O.J.; Baron, R.; Mayer, J.W.
- 卷第12卷
- 期第9期
- 印刷ISSN0018-9383
- 电子ISSN1557-9646
- 文件大小189.88KB
- 发表时间1965
- DOI10.1109/t-ed.1965.15572
- 页码506-506
同标题推荐
Noise figure of UHF transistors as a function of frequency and bias conditionsAgouridis, D.C.; van der Ziel, A. · 1967
[IEEE 10th European Microwave Conference, 1980 - Warszawa, Poland (1980.10.4-1980.10.6)] 10th European Microwave Conference, 1980 - Noise Figure Measurement of the UHF and Microwave TransistorsAdamski, Wladyslaw · 1980