发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Characterization of thin film thickness and density by low angle X-ray interference

Characterization of thin film thickness and density by low angle X-ray interference

Jude H. Koenig; Gene J. Carron

作者Jude H. Koenig; Gene J. Carron
卷第2卷
期第7期
印刷ISSN0025-5408
文件大小780.73KB
发表时间1967
DOI10.1016/0025-5408(67)90072-4
页码509-522

← 返回【学霸图书馆】主页