![SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - <title>AXAF HXDS germanium solid state detectors</title>]()
SPIE Proceedings [SPIE Optical Science, Engineering and Instrumentation '97 - San Diego, CA (Sunday 27 July 1997)] Grazing Incidence and Multilayer X-Ray Optical Systems - <title>AXAF HXDS germanium solid state detectors</title>McDermott, Walter C.; Kellogg, Edwin M.; Wargelin, Bradford J.; Evans, Ian N.; Vitek, S. A.; Tsiang, Eugene Y.; Schwartz, Daniel A.; Edgar, Richard J.; Kraft, Stefan; Scholze, Frank; Thornagel, R.; Ulm, Gerhard; Weisskopf, Martin C.; O'Dell, Stephen L.; Tennant, Allyn F.; Kolodziejczak, Jeffery J.; Zirnstein, C. G.; Hoover, Richard B.; Walker II, Arthur B. C. · 1997