Study of thin film annealing by ellipsometry
- 作者J.R. Adams; K.K. Rao
- 卷第16卷
- 文件大小381.26KB
- 发表时间1969
- DOI10.1016/0039-6028(69)90033-8
- 页码382-389
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Reply to the comment of L.A. Bruce on “a study of the optical properties and of the physical adsorption of gases on silver single crystal surfaces by low energy electron diffraction and ellipsometry”R.F. Steiger; J.M. Morabito Jr.; G.A. Somorjai; R.H. Muller · 1970