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[IRE 1969 International Electron Devices Meeting -  ()] 1969 International Electron Devices Meeting - Thermal characteristics of high speed devices

[IRE 1969 International Electron Devices Meeting - ()] 1969 International Electron Devices Meeting - Thermal characteristics of high speed devices

Joy, R.C
  • 作者Joy, R.C
  • 文件大小176.48KB
  • 发表时间1969
  • DOI10.1109/iedm.1969.188165
  • 页码112-114
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