![SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - A background light resistant TOF range finder with integrated PIN photodiode in 0.35μm CMOS]()
SPIE Proceedings [SPIE SPIE Optical Metrology 2013 - Munich, Germany (Monday 13 May 2013)] Videometrics, Range Imaging, and Applications XII; and Automated Visual Inspection - A background light resistant TOF range finder with integrated PIN photodiode in 0.35μm CMOSDavidovic, Milos; Remondino, Fabio; Shortis, Mark R.; Seiter, Johannes; Hofbauer, Michael; Beyerer, Jürgen; Puente León, Fernando; Gaberl, Wolfgang; Zimmermann, Horst · 2013