Low-temperature photocapacity measurement in MOS structure
- 作者E. Kamieniecki
- 卷第16卷
- 期第12期
- 印刷ISSN0038-1101
- 文件大小466.87KB
- 发表时间1973
- DOI10.1016/0038-1101(73)90066-x
- 页码1487-1493
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