[IEEE 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - Vienna, Austria (2010.04.14-2010.04.16)] 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems - How to reduce size of a signature-based diagnostic dictionary used for testing of connectionsTomasz, Garbolino; Krzysztof, Gucwa; Andrzej, Hlawiczka · 2010

[IEEE 2015 8th International Symposium on Computational Intelligence and Design (ISCID) - Hangzhou, China (2015.12.12-2015.12.13)] 2015 8th International Symposium on Computational Intelligence and Design (ISCID) - Research and Design of Diagnostic System of Contract Claim Based on Web and Multi-agentSun, Xianli; Yang, Hongping; Qin, Guoji · 2015

Low-power subthreshold to above threshold level shifters in 90 nm and 65 nm processAmir Hasanbegovic; Snorre Aunet · 2011

[IEEE 2009 NORCHIP - Trondheim, Norway (2009.11.16-2009.11.17)] 2009 NORCHIP - Low-power subthreshold to above threshold level shifter in 90 nm processHasanbegovic, Amir; Aunet, Snorre · 2009

Heavy Ion Characterization of Temporal-, Dual- and Triple Redundant Flip-Flops Across a Wide Supply Voltage Range in a 65 nm Bulk CMOS ProcessHasanbegovic, Amir; Aunet, Snorre · IEEE Transactions on Nuclear Science · 2016

Supply Voltage Dependency on the Single Event Upset Susceptibility of Temporal Dual-Feedback Flip-Flops in a 90 nm Bulk CMOS ProcessHasanbegovic, Amir; Aunet, Snorre · IEEE Transactions on Nuclear Science · 2015

[IEEE Systems (DDECS) - Cottbus, Germany (2011.04.13-2011.04.15)] 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems - Muller C-elements based on minority-3 functions for ultra low voltage suppliesBerge, Hans Kristian Otnes; Hasanbegovic, Amir; Aunet, Snorre · 2011