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Theoretical influence of surface states and bulk traps on thin film transistor characteristics

Theoretical influence of surface states and bulk traps on thin film transistor characteristics

A. van Calster; H.J. Pauwels

作者A. van Calster; H.J. Pauwels
卷第18卷
印刷ISSN0038-1101
文件大小681.07KB
发表时间1975
DOI10.1016/0038-1101(75)90141-0
页码691-698

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