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[IRE 1975 International Electron Devices Meeting -  ()] 1975 International Electron Devices Meeting - Noise limits of GaAs and InP microwave FETs determined by dynamic analysis

[IRE 1975 International Electron Devices Meeting - ()] 1975 International Electron Devices Meeting - Noise limits of GaAs and InP microwave FETs determined by dynamic analysis

Frey, J.; Maloney, T.J.
  • 作者Frey, J.; Maloney, T.J.
  • 文件大小202.57KB
  • 发表时间1975
  • DOI10.1109/iedm.1975.188872
  • 页码251-253
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