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Determination of the surface structure of layered compounds by low-energy electron diffraction

Determination of the surface structure of layered compounds by low-energy electron diffraction

B. J. Mrstik; R. Kaplan; T. L. Reinecke; M. Van Hove; S. Y. Tong
  • 作者B. J. Mrstik; R. Kaplan; T. L. Reinecke; M. Van Hove; S. Y. Tong
  • 卷第38卷
  • 期第2期
  • 印刷ISSN0369-3554
  • 电子ISSN1826-9877
  • 文件大小785.95KB
  • 发表时间1977-04-11
  • DOI10.1007/bf02723509
  • 页码387-395
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