Accelerated life testing of flexible printed circuits Part II—Failure modes in flexible printed circuits coated with UV-cured resins : R. H. Delaney and J. N. Lahti. IEEE Reliab. Phys. 108 (1976)

• 卷第16卷
• 期第1期
• 印刷ISSN0026-2714
• 文件大小116.36KB
• 发表时间1977
• DOI10.1016/0026-2714(77)90023-3