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Characterization of metal surfaces by secondary ion mass spectrometry x-ray photoelectron spectroscopy

Characterization of metal surfaces by secondary ion mass spectrometry x-ray photoelectron spectroscopy

Hewitt, R. W.; Shepard, A. T.; Baitinger, W. E.; Winograd, Nicholas.; Ott, G. L.; Delgass, W. N.
  • 期刊名称Analytical Chemistry
  • 作者Hewitt, R. W.; Shepard, A. T.; Baitinger, W. E.; Winograd, Nicholas.; Ott, G. L.; Delgass, W. N.
  • 卷第50卷
  • 期第9期
  • 印刷ISSN0003-2700
  • 电子ISSN1520-6882
  • 文件大小566.07KB
  • 发表时间1978-08
  • DOI10.1021/ac50031a024
  • 页码1286-1290
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