New contact resistance profiling method for the assessment of III–V alloy multilayer structures
- 期刊名称Electronics Letters
- 作者Goodfellow, R.C.; Carter, A.C.; Davis, R.; Hill, C.
- 卷第14卷
- 期第11期
- 印刷ISSN0013-5194
- 文件大小490.70KB
- 发表时间1978
- DOI10.1049/el:19780223
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