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SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - <title>Minutes Of The Round Table On Photo-Sensitive Surfaces</title>

SPIE Proceedings [SPIE First European Conference on Optics Applied to Metrology - Strasbourg, France (Wednesday 26 October 1977)] 1st European Conf on Optics Applied to Metrology - Minutes Of The Round Table On Photo-Sensitive Surfaces

Christy, J. P.; Sagaut, J.; Tribillon, J. L.; Grosmann, Michel H.; Meyrueis, Patrick
  • 作者Christy, J. P.; Sagaut, J.; Tribillon, J. L.; Grosmann, Michel H.; Meyrueis, Patrick
  • 卷第136卷
  • 印刷ISSN0277-786X
  • 文件大小119.77KB
  • 发表时间1978
  • DOI10.1117/12.956184
  • 页码355-357
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