Characterization of Thin by X-Ray Fluorescence and Diffraction Analysis
- 期刊名称Advances in X-ray Analysis
- 作者Huang, T. C.; Parrish, W.
- 卷第22卷
- 印刷ISSN0376-0308
- 电子ISSN2631-3626
- 文件大小823.38KB
- 发表时间1978
- DOI10.1154/S0376030800016402
- 页码43-63
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