In-process monitoring and control of doping gas concentration during vapor phase silicon epitaxial growth by using a flame photometric detector
Takaya Suzuki; Yosuke Inoue; Mitsuru Ura; Takuzo Ogawa; Yoshimitsu Sugita
- 作者Takaya Suzuki; Yosuke Inoue; Mitsuru Ura; Takuzo Ogawa; Yoshimitsu Sugita
- 卷第45卷
- 印刷ISSN0022-0248
- 文件大小785.42KB
- 发表时间1978
- DOI10.1016/0022-0248(78)90421-9
- 页码108-117