![[IEEE Electrical/Electronics Insulation Conference - Chicago, IL, USA (4-7 Oct. 1993)] Proceedings of Electrical/Electronics Insulation Conference - An optical technique to detect the degradation of electrical insulation]()
[IEEE Electrical/Electronics Insulation Conference - Chicago, IL, USA (4-7 Oct. 1993)] Proceedings of Electrical/Electronics Insulation Conference - An optical technique to detect the degradation of electrical insulationBamji, S.S.; Bulinski, A.T.; Shen, J. · 1993