发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Dielectric Breakdown of Silicon Dioxide Thin Film Capacitors Using Polycrystalline Silicon and Aluminum Electrodes

Dielectric Breakdown of Silicon Dioxide Thin Film Capacitors Using Polycrystalline Silicon and Aluminum Electrodes

Ormond, Douglas W.

期刊名称Journal of The Electrochemical Society
作者Ormond, Douglas W.
卷第126卷
期第1期
印刷ISSN0013-4651
文件大小376.40KB
发表时间1979
DOI10.1149/1.2128976

← 返回【学霸图书馆】主页