A Simple Procedure for Computing Performance Characteristics of Truncated Sequential Tests with Exponential Lifetimes
Peichuen Kao, Edward P. C. Kao and Jack M. Mogg
- 期刊名称Technometrics
- 作者Peichuen Kao, Edward P. C. Kao and Jack M. Mogg
- 卷第21卷
- 期第2期
- 印刷ISSN0040-1706
- 文件大小509.50KB
- 发表时间1979-05
- DOI10.2307/1268520
- 页码229-232