![[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - On-line monitoring of system health using on-chip SRAMs as a wearout sensor]()
[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - On-line monitoring of system health using on-chip SRAMs as a wearout sensorKim, Woongrae; Liu, Taizhi; Milor, Linda · 2017