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Anomalous surface damage in ion bombarded silicon from channelling-backscattering measurements

Anomalous surface damage in ion bombarded silicon from channelling-backscattering measurements

  • 期刊名称Radiation Effects
  • 卷第53卷
  • 印刷ISSN0033-7579
  • 文件大小139.34KB
  • 发表时间1980-01
  • DOI10.1080/00337578008207102
  • 页码97-97
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