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SPIE Proceedings [SPIE 1980 Los Angeles Technical Symposium - Los Angeles (Monday 4 February 1980)] Optics in Metrology and Quality Assurance - <title>Computerized Measuring Microscope</title>

SPIE Proceedings [SPIE 1980 Los Angeles Technical Symposium - Los Angeles (Monday 4 February 1980)] Optics in Metrology and Quality Assurance - Computerized Measuring Microscope

Schoonmaker, Thomas D.; Kasdan, Harvey L.

作者Schoonmaker, Thomas D.; Kasdan, Harvey L.
卷第220卷
印刷ISSN0277-786X
文件大小11164.20KB
发表时间1980
DOI10.1117/12.958591
页码140-147

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