Thin film characterization using analytical electron microscopy
- 作者Nestor J. Zaluzec
- 卷第72卷
- 期第1期
- 印刷ISSN0040-6090
- 文件大小1067.60KB
- 发表时间1980
- DOI10.1016/0040-6090(80)90572-6
- 页码177-192
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