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Proton-magnetic-resonance studies of microstructure in plasma-deposited amorphous-silicon—hydrogen films

Proton-magnetic-resonance studies of microstructure in plasma-deposited amorphous-silicon—hydrogen films

Reimer, Jeffrey A.; Vaughan, Robert W.; Knights, John C.
  • 期刊名称Physical Review B
  • 作者Reimer, Jeffrey A.; Vaughan, Robert W.; Knights, John C.
  • 卷第24卷
  • 期第6期
  • 印刷ISSN0163-1829
  • 文件大小486.39KB
  • 发表时间1981-9-15
  • DOI10.1103/PhysRevB.24.3360
  • 页码3360-3370
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