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XPS measurement of GaAs–AlAs heterojunction band discontinuities: Growth sequence dependence

XPS measurement of GaAs–AlAs heterojunction band discontinuities: Growth sequence dependence

Waldrop, J. R.
  • 期刊名称Journal of Vacuum Science and Technology
  • 作者Waldrop, J. R.
  • 卷第19卷
  • 期第3期
  • 印刷ISSN0022-5355
  • 文件大小697.42KB
  • 发表时间1981-9
  • DOI10.1116/1.571130
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