Electrical and Structural Properties of Grain Boundary in Polycrystalline Si
- 期刊名称MRS Proceedings
- 作者Young, R. T.; Narayan, J.; Chang, Y. K.
- 卷第5卷
- 电子ISSN1946-4274
- 文件大小1980.66KB
- 发表时间1981-1
- DOI10.1557/proc-5-111
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