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Saturated open circuit photovoltage – a new method for measuring the carrier lifetime at high excitation level

Saturated open circuit photovoltage – a new method for measuring the carrier lifetime at high excitation level

K. H. Herrmann; T. X. Hoai

作者K. H. Herrmann; T. X. Hoai
卷第64卷
期第1期
印刷ISSN1862-6319
文件大小145.97KB
发表时间1981
DOI10.1002/pssa.2210640161

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