![Raman Scattering Studies of Electrically Active Impurities in in Situ B-Doped Silicon Nanowires: Effects of Annealing and Oxidation]()
Raman Scattering Studies of Electrically Active Impurities in in Situ B-Doped Silicon Nanowires: Effects of Annealing and OxidationKawashima, Takahiro; Imamura, Goh; Saitoh, Tohru; Komori, Kazunori; Fujii, Minoru; Hayashi, Shinji · The Journal of Physical Chemistry C · 2007