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SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Optical Systems Engineering II - <title>Use Of Phase Measuring Interferometry In Quantity Production Of High Quality Optics</title>

SPIE Proceedings [SPIE 1982 Los Angeles Technical Symposium - Los Angeles (Wednesday 27 January 1982)] Optical Systems Engineering II - Use Of Phase Measuring Interferometry In Quantity Production Of High Quality Optics

Yoder, Jr., P. R.; Grosso, R. P.; Crane, R.; Yoder, Jr., Paul R.

作者Yoder, Jr., P. R.; Grosso, R. P.; Crane, R.; Yoder, Jr., Paul R.
卷第330卷
印刷ISSN0277-786X
文件大小7250.52KB
发表时间1982
DOI10.1117/12.934260
页码84-89

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