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Morphological fluctuations in discharge-produced μc-Si:H studied by small angle X-ray scattering

Morphological fluctuations in discharge-produced μc-Si:H studied by small angle X-ray scattering

Seiichi Miyazaki; Yasuyoshi Mishima; Masataka Hirose; Yukio Osaka

作者Seiichi Miyazaki; Yasuyoshi Mishima; Masataka Hirose; Yukio Osaka
文件大小158.23KB
发表时间1983
DOI10.1016/0022-3093(83)90288-0
页码787-790

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