[IEEE 53rd Electronic Components and Technology Conference, 2003. - New Orleans, Louisiana, USA (May 27-30, 2003)] 53rd Electronic Components and Technology Conference, 2003. Proceedings. - Thermal modeling and measurement of AlGaN/GaN FETs built on sapphire and SiC substratesJeong Park, ; Kakovitch, D.; Moo whan Shin, ; Chin C. Lee, · 2003

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