Characterization of Heteroepitaxial Silicon Layers on Sapphire by Rutherford-Backscattering (RBS) Analyses
- 作者H. G. Schneider; H. Karge; B. Weber
- 卷第77卷
- 期第1期
- 印刷ISSN1862-6319
- 文件大小360.00KB
- 发表时间1983
- DOI10.1002/pssa.2210770124
- 页码201-205
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