[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Detection of gate-oxide defects with timing tests at reduced power supplyQian, Xi; Chao Han, ; Singh, Adit D. · 2012