发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Modification to the reduction technique of Thomas Case for obtaining a simplified reliability expression : K. K. Govil and R. A. Agarwala. Microelectron. Reliab.23 (5), 793 (1983)

Modification to the reduction technique of Thomas Case for obtaining a simplified reliability expression : K. K. Govil and R. A. Agarwala. Microelectron. Reliab.23 (5), 793 (1983)

卷第24卷
期第4期
印刷ISSN0026-2714
文件大小128.33KB
发表时间1984
DOI10.1016/0026-2714(84)90260-9

← 返回【学霸图书馆】主页