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Nickel 3d electron distribution of small particles embedded in SiO and of bulk nickel-SiO interface

Nickel 3d electron distribution of small particles embedded in SiO and of bulk nickel-SiO interface

D. Fargues; F. Vergand; C. Bonnelle

作者D. Fargues; F. Vergand; C. Bonnelle
卷第156卷
文件大小432.14KB
发表时间1985
DOI10.1016/0039-6028(85)90229-8
页码590-596

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