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Revealing of defects in InP by shallow (submicron) photoetching

Revealing of defects in InP by shallow (submicron) photoetching

Weyher, J. L.; Giling, L. J.
  • 期刊名称Journal of Applied Physics
  • 作者Weyher, J. L.; Giling, L. J.
  • 卷第58卷
  • 期第1期
  • 印刷ISSN0021-8979
  • 文件大小676.43KB
  • 发表时间1985
  • DOI10.1063/1.335715
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