The challenge of reliability
- 期刊名称IEEE Circuits and Devices Magazine
- 作者Strube, Arthur R.
- 卷第1卷
- 期第3期
- 印刷ISSN8755-3996
- 文件大小8099.20KB
- 发表时间1985-05
- DOI10.1109/mcd.1985.6311969
- 页码40-45
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