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[IRE 1985 International Electron Devices Meeting -  ()] 1985 International Electron Devices Meeting - Thin oxide reliability

[IRE 1985 International Electron Devices Meeting - ()] 1985 International Electron Devices Meeting - Thin oxide reliability

Chenmi,
  • 作者Chenmi,
  • 文件大小346.62KB
  • 发表时间1985
  • DOI10.1109/iedm.1985.190977
  • 页码368-371
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