Microprocessor Based Digital IC Tester
- 期刊名称IETE Journal of Education
- 作者Krishna, D. Rama; Krishna, L. Rama; Kumar, D. Suresh; Sunil, P. Samuel
- 卷第26卷
- 期第3期
- 电子ISSN0974-7338
- 文件大小553.57KB
- 发表时间1985-07
- DOI10.1080/09747338.1985.11436066
- 页码105-110
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