4528504 Pulsed linear integrated circuit tester
- 作者MaxC Thornton; Paul Kuntz; Russell Meyer; KennethM Rosier
- 卷第26卷
- 期第1期
- 印刷ISSN0026-2714
- 文件大小79.61KB
- 发表时间1986
- DOI10.1016/0026-2714(86)90797-3
Analysis of a 2-unit (dissimilar) repairable system subject to slow switchM.N. Gopalan; R. Radhakrishnan; A. Vijaya Kumar · 1985
Cost-benefit analysis of an n-unit repairable adaptive systemA. Vijayakumar; M.N. Gopalan; R. Radhakrishnan · 1985
Stochastic analysis of a n-unit adaptive system with arbitrary switchover timeA. Vijayakumar; M.N. Gopalan; R. Radhakrishnan · 1985
Cost-benefit analysis of a two-unit system subject to random serviceM.N. Gopalan; R. Radhakrishnan · 1985
Stochastic analysis of one-server two-unit adaptive system with slow switchM.N. Gopalan; R. Radhakrishnan · 1985
Cost-benefit analysis of a two-unit adaptive system with slow switchM.N. Gopalan; R. Radhakrishnan; A. Vijayakumar · 1985
Cost-benefit analysis of a 2-unit cold standby system subject to slow switchM.N. Gopalan; R. Radhakrishnan; A. Vijayakumar · 1984
Stochastic analysis of a two unit adaptive system subject to slow switch with random serviceR. Radhakrishnan; M.N. Gopalan · 1985