Electronic Structure of the Si(111)2 × 1 Surface by Scanning-Tunneling Microscopy
- 期刊名称Physical Review Letters
- 作者Stroscio, Joseph A.; Feenstra, R. M.; Fein, A. P.
- 卷第57卷
- 期第20期
- 印刷ISSN0031-9007
- 文件大小523.10KB
- 发表时间1986-11-17
- DOI10.1103/PhysRevLett.57.2579
- 页码2579-2582
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