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Evidence of a charge induced contribution to the sputtering yield of insulating and semiconducting materials

Evidence of a charge induced contribution to the sputtering yield of insulating and semiconducting materials

Eccles, A. J.; van den Berg, J. A.; Brown, A.; Vickerman, J. C.
  • 期刊名称Applied Physics Letters
  • 作者Eccles, A. J.; van den Berg, J. A.; Brown, A.; Vickerman, J. C.
  • 卷第49卷
  • 期第4期
  • 印刷ISSN0003-6951
  • 文件大小432.08KB
  • 发表时间1986
  • DOI10.1063/1.97165
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